I am currently working in a development of error detection and
correction algorithm. I found a sample ECC algorithm provided by
Samsung for NAND flash.

Please checkup the algorithm following link.

http://www.samsung.com/Products/Sem...ppnote/samsung_...

The ECC algorithm detects all Single bit errors. It generates 3 ECC
(Parity code) bytes for a given data of 512bytes

We need to generate ECC codes for the original data and corrupted data.
We can generate ECC bytes using the function make_ecc_512(). Later we
need to compare them using the function.compare_ecc_512().

Problem:
It doesn't detects 0000 bits change to 1111 bit. & viceversa. (ie. Data
0x0000 changes to 0xFFFF is detected as NO_ERROR).

Reason:
The ECC generated for 0x0000 and 0xFFFF are the same.

Can anyone help me to resolve the issue.

Thanks in advance.

Regards,
Hari